Checkpoint’s new RFID labels that are certified in the United States by ARC at the Auburn University RFID Lab for four categories, including footwear.
The new RFID labels, shown at the 2015 NRF Annual Convention and EXPO in New York, have integrated UCODE 7 chips from NXP Semiconductors.
According to Uwe Sydon, Checkpoint’s senior vice president of innovation, “Several major apparel retailers have expressed an interest in our new labels, particularly those with broad product lines that include footwear and have large-scale deployment needs. With retailers devoting more inventory space to footwear, inventory management becomes even more critical, and our new labels answer their challenges.”
RFID identifies each product and attribute, providing retailers with inventory control and visibility, enabling them to reduce out-of-stocks, and increase shelf availability the product makers say. Also, using RFID tags can help retailers better manage shrink by identifying items that may have been stolen so they can be replenished, further improving inventory accuracy and shelf availability, it’s claimed. Source tagging shifts the tag application process from a manual labour-intensive process at the store to an automated process at the point of manufacture, the company says.
Zephyr 3, Breeze
The Zephyr 3, offered with a label size of 50x30mm, is for use with all of Checkpoint’s RFID products, including its RFID EAS Overhead Solution, the EVOLVE Exclusive E10 antenna, and others. It has received certification from the Auburn University RFID Lab’s ARC program for the newly created M category in North America, which includes denim, polybagged apparel, hanging apparel and footwear. This allows retailers to use the same tag across much of their merchandise, streamlining their source tagging operations. Meanwhile, Checkpoint’s Breeze label offers the same capabilities and is offered in a small format of 42x16mm.
“Checkpoint’s latest RFID labels meet ARC’s newest performance specification. Checkpoint has been very proactive in designing and validating inlays to meet retailers’ and brand owners’ requirements,” said Justin Patton, RFID Lab Director, Auburn University.
Visit www.CheckpointSystems.com.
